Smart Structures and Systems
Volume 8, Number 1, 2011, pages 139-155
DOI: 10.12989/sss.2011.8.1.139
A wireless impedance analyzer for automated tomographic mapping of a nanoengineered sensing skin
Sukhoon Pyo , Kenneth J. Loh , Tsung-Chin Hou , Erik Jarva , Jerome P. Lynch
Abstract
Key Words
structural health monitoring; sensing skin; wireless sensor; carbon nanotube; bio-inspired sensing; impedance tomography.
Address
- Sukhoon Pyo — Dept. of Civil & Environmental Engineering, University of Michigan, Ann Arbor, MI 48109, USA
- Kenneth J. Loh — Dept. of Civil & Environmental Engineering, University of California, Davis, CA 95616, USA
- Tsung-Chin Hou — Dept. of Civil Engineering, National Cheng Kung University(NCKU), Tainan, Taiwan
- Erik Jarva — Dept. of Electrical Engineering & Computer Science, University of Michigan, Ann Arbor, MI 48109, USA
- Jerome P. Lynch — Dept. of Civil & Environmental Engineering, University of Michigan, Ann Arbor, MI 48109, USA, Dept. of Electrical Engineering & Computer Science, University of Michigan, Ann Arbor, MI 48109, USA
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