A wireless impedance analyzer for automated tomographic
mapping of a nanoengineered sensing skin
Sukhoon Pyo,Kenneth J. Loh,Tsung-Chin Hou,Erik Jarva,Jerome P. Lynch
Abstract
Polymeric thin-film assemblies whose bulk electrical conductivity and mechanical performance have been enhanced by single-walled carbon nanotubes are proposed for measuring strain and corrosion activity in metallic structural systems. Similar to the dermatological system found in animals, the proposed self-sensing thin-film assembly supports spatial strain and pH sensing via localized changes in electrical conductivity. Specifically, electrical impedance tomography (EIT) is used to create detailed mappings of film conductivity over its complete surface area using electrical measurements taken at the film boundary. While EIT is a powerful means of mapping the sensing skin
Sukhoon Pyo: Dept. of Civil & Environmental Engineering, University of Michigan, Ann Arbor, MI 48109, USA
Kenneth J. Loh: Dept. of Civil & Environmental Engineering, University of California, Davis, CA 95616, USA
Tsung-Chin Hou: Dept. of Civil Engineering, National Cheng Kung University(NCKU), Tainan, Taiwan
Erik Jarva: Dept. of Electrical Engineering & Computer Science, University of Michigan, Ann Arbor, MI 48109, USA
Jerome P. Lynch: Dept. of Civil & Environmental Engineering, University of Michigan, Ann Arbor, MI 48109, USA, Dept. of Electrical Engineering & Computer Science, University of Michigan, Ann Arbor, MI 48109, USA
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